Theoretical Investigation of Dependable Computing

This issue includes fifteen papers selected from the 2010 Conference on Dependable Computing (CDC2010). The papers in this issue mainly focus on the theoretical investigation of Dependable Computing. Thorough theoretical investigation is the cornerstone of successful applications. It is an excitement to have all experts, professionals and scholars share their creative thoughts and inspirations on the theoretical aspects of dependable computing. In the first paper, Junqing Liu et al. proposed a blotch identification algorithm for archive film restoration based on edge detection, where the blotch identification area is limited to edge pixels and pixels nearby. In addition, a non-blotch edge removal approach is proposed to remove partial non-blotch edge points and a scanning method is used to identify all blotches from remaining edge points. Xinsai Wang et al. presented an adaptive algorithm with automatic estimation of gradient histogram threshold for segmentation of infrared images. Yuan Tian et al. proposed a new combination strategy for high-accuracy recognition of wheat leaf diseases, which is based on supervised vector machine for pattern recognition of wheat leaf diseases. Zhang Jingcheng et al. presented spectral feature selection method for winter wheat yellow rust detection based on continuous wavelet analysis. It was found that the variation of chlorophyll content is closely associated with the yellow rust infection. Four spectral features are identified by the continuous wavelet analysis, which are proved to be powerful in discriminating the yellow rust infected and non-infected winter wheat plants.